Yb diffusion barriers at Hg1-xCdxTe interfaces with Al, In, and Cr

A. Raisanen; D. J. Peterman; A. Wall; S. Chang; G. Haugstad; X. Yu; A. Franciosi

doi:10.1016/0038-1098(89)90541-3

Yb diffusion barriers at Hg_1-xCd_xTe interfaces with Al, In, and Cr

A. Raisanen, D. J. Peterman, A. Wall, S. Chang, G. Haugstad, X. Yu, A. Franciosi

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Abstract

We have performed synchrotron radiation photoemission studies of the formation of Hg_1-xCd_xTe/metal junctions in the presence of predeposited thin (3-15 Å) Yb layers. Metals examined include Cr, In, and Al. Semi-empirical calculations of bulk binary thermodynamic parameters for each interface suggest that the rare-earth metal should act as an effective diffusion barrier. Correspondingly, we found that Yb interlayers reduce or eliminate metal-Te reaction, Te outdiffusion, and the Hg-depletion of the near-surface region in all cases examined.

Original language	English (US)
Pages (from-to)	585-589
Number of pages	5
Journal	Solid State Communications
Volume	71
Issue number	7
DOIs	https://doi.org/10.1016/0038-1098(89)90541-3
State	Published - Aug 1989

Bibliographical note

Funding Information:
Acknowledgements-This work was supported by the Office of Naval Research under grants NOOO14-84-K-0545 and NOOO14-89-J-1407, by the McDonnell Douglas Independent Research and Development Program, and by the NSF Center for Interfacial Engineering of the University of Minnesota. We are in debt to G.D. Davis and D.J. Friedman for communicating their results to us prior to publication. We thank the entire staff of the Synchrotron Radiation Center of the University of Wisconsin-Madison: supported by the National Science Foundatron, for their cheerful support.

Copyright:
Copyright 2014 Elsevier B.V., All rights reserved.

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10.1016/0038-1098(89)90541-3

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@article{f05bee30797b4cb694d7e69d8a1c865d,

title = "Yb diffusion barriers at Hg1-xCdxTe interfaces with Al, In, and Cr",

abstract = "We have performed synchrotron radiation photoemission studies of the formation of Hg1-xCdxTe/metal junctions in the presence of predeposited thin (3-15 {\AA}) Yb layers. Metals examined include Cr, In, and Al. Semi-empirical calculations of bulk binary thermodynamic parameters for each interface suggest that the rare-earth metal should act as an effective diffusion barrier. Correspondingly, we found that Yb interlayers reduce or eliminate metal-Te reaction, Te outdiffusion, and the Hg-depletion of the near-surface region in all cases examined.",

author = "A. Raisanen and Peterman, {D. J.} and A. Wall and S. Chang and G. Haugstad and X. Yu and A. Franciosi",

note = "Funding Information: Acknowledgements-This work was supported by the Office of Naval Research under grants NOOO14-84-K-0545 and NOOO14-89-J-1407, by the McDonnell Douglas Independent Research and Development Program, and by the NSF Center for Interfacial Engineering of the University of Minnesota. We are in debt to G.D. Davis and D.J. Friedman for communicating their results to us prior to publication. We thank the entire staff of the Synchrotron Radiation Center of the University of Wisconsin-Madison: supported by the National Science Foundatron, for their cheerful support. Copyright: Copyright 2014 Elsevier B.V., All rights reserved.",

year = "1989",

month = aug,

doi = "10.1016/0038-1098(89)90541-3",

language = "English (US)",

volume = "71",

pages = "585--589",

journal = "Solid State Communications",

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T1 - Yb diffusion barriers at Hg1-xCdxTe interfaces with Al, In, and Cr

AU - Raisanen, A.

AU - Peterman, D. J.

AU - Wall, A.

AU - Chang, S.

AU - Haugstad, G.

AU - Yu, X.

AU - Franciosi, A.

N1 - Funding Information: Acknowledgements-This work was supported by the Office of Naval Research under grants NOOO14-84-K-0545 and NOOO14-89-J-1407, by the McDonnell Douglas Independent Research and Development Program, and by the NSF Center for Interfacial Engineering of the University of Minnesota. We are in debt to G.D. Davis and D.J. Friedman for communicating their results to us prior to publication. We thank the entire staff of the Synchrotron Radiation Center of the University of Wisconsin-Madison: supported by the National Science Foundatron, for their cheerful support. Copyright: Copyright 2014 Elsevier B.V., All rights reserved.

PY - 1989/8

Y1 - 1989/8

N2 - We have performed synchrotron radiation photoemission studies of the formation of Hg1-xCdxTe/metal junctions in the presence of predeposited thin (3-15 Å) Yb layers. Metals examined include Cr, In, and Al. Semi-empirical calculations of bulk binary thermodynamic parameters for each interface suggest that the rare-earth metal should act as an effective diffusion barrier. Correspondingly, we found that Yb interlayers reduce or eliminate metal-Te reaction, Te outdiffusion, and the Hg-depletion of the near-surface region in all cases examined.

AB - We have performed synchrotron radiation photoemission studies of the formation of Hg1-xCdxTe/metal junctions in the presence of predeposited thin (3-15 Å) Yb layers. Metals examined include Cr, In, and Al. Semi-empirical calculations of bulk binary thermodynamic parameters for each interface suggest that the rare-earth metal should act as an effective diffusion barrier. Correspondingly, we found that Yb interlayers reduce or eliminate metal-Te reaction, Te outdiffusion, and the Hg-depletion of the near-surface region in all cases examined.

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DO - 10.1016/0038-1098(89)90541-3

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SP - 585

EP - 589

JO - Solid State Communications

JF - Solid State Communications

IS - 7

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