Abstract
ReRAM crossbar array as a high-parallel fast and energy-efficient structure attracts much attention, especially on the acceleration of Deep Neural Network (DNN) inference on one specific task. However, due to the high energy consumption of weight re-programming and the ReRAM cells' low endurance problem, adapting the crossbar array for multiple tasks has not been well explored. In this paper, we propose XMA, a novel crossbar-aware shift-based mask learning method for multiple task adaption in the ReRAM crossbar DNN accelerator for the first time. XMA leverages the popular mask-based learning algorithm's benefit to mitigate catastrophic forgetting and learn a task-specific, crossbar column-wise, and shift-based multi-level mask, rather than the most commonly used element-wise binary mask, for each new task based on a frozen backbone model. With our crossbar-aware design innovation, the required masking operation to adapt for a new task could be implemented in an existing crossbar-based convolution engine with minimal hardware/memory overhead and, more importantly, no need for power-hungry cell re-programming, unlike prior works. The extensive experimental results show that, compared with state-of-the-art multiple task adaption Piggyback method [1], XMA achieves 3.19% higher accuracy on average, while saving 96.6% memory overhead. Moreover, by eliminating cell re-programming, XMA achieves ∼4.3x higher energy efficiency than Piggyback.
Original language | English (US) |
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Title of host publication | Proceedings of the 59th ACM/IEEE Design Automation Conference, DAC 2022 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 271-276 |
Number of pages | 6 |
ISBN (Electronic) | 9781450391429 |
DOIs | |
State | Published - Jul 10 2022 |
Externally published | Yes |
Event | 59th ACM/IEEE Design Automation Conference, DAC 2022 - San Francisco, United States Duration: Jul 10 2022 → Jul 14 2022 |
Publication series
Name | Proceedings - Design Automation Conference |
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ISSN (Print) | 0738-100X |
Conference
Conference | 59th ACM/IEEE Design Automation Conference, DAC 2022 |
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Country/Territory | United States |
City | San Francisco |
Period | 7/10/22 → 7/14/22 |
Bibliographical note
Publisher Copyright:© 2022 ACM.
Keywords
- in-memory computing
- multi-task learning
- neural networks