X-ray reflectivity determination of interface roughness and correlated with magnetic coercivity of Co82Cr12Pt4Ta4 thin film

Ding Jin, Jian Ping Wang, Hao Gong

Research output: Contribution to journalConference articlepeer-review

Abstract

Co82Cr12Pt4Ta4Cr/Glass thin films separately deposited by a DC sputtering system at different working pressure were characterized. Magnetic properties were determined by vibrating sample magnetometer (VSM). X-ray reflectivity (XRR) spectrums were carried out using an MRD system. The interface condition of the films was accurately determined. Interfacial roughness was correlated with magnetic coercivity, due to its ability to partially represent grain size distribution and degradation of the mismatch.

Original languageEnglish (US)
Pages (from-to)AQ-02
JournalDigests of the Intermag Conference
StatePublished - Jan 1 2000
Event2000 IEEE International Magnetics Conference-2000 IEEE INTERMAG - Toronto, Ont, Can
Duration: Apr 9 2000Apr 13 2000

Fingerprint Dive into the research topics of 'X-ray reflectivity determination of interface roughness and correlated with magnetic coercivity of Co<sub>82</sub>Cr<sub>12</sub>Pt<sub>4</sub>Ta<sub>4</sub> thin film'. Together they form a unique fingerprint.

Cite this