Work function topography on thin anodic TiO2 films

Shun Ming Huang, S. Yee, R. T. Atanasoski, C. S. McMillan, R. A. Oriani, W. H. Smyrl

Research output: Contribution to journalArticlepeer-review

16 Scopus citations

Abstract

Work function topography maps of a heterogeneous oxide surface were produced by a scanning Kelvin probe. The specimens studied were anodically grown TiO2 films on polycrystalline titanium. The defect densities in this oxide vary from one metal grain to another, and this is responsible for the variation of work function with location over the various titanium grains. The Kelvin probe map measures the distribution of surface charge on the oxide surface, a property which influences the catalytic, corrosion, and photoelectrochemical properties of such a surface. These measurements may be extended to other thin oxide films as well.

Original languageEnglish (US)
Pages (from-to)L63-L64
JournalJournal of the Electrochemical Society
Volume138
Issue number11
DOIs
StatePublished - 1991

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