Width quantization aware FinFET circuit design

Jie Gu, John Keane, Sachin S Sapatnekar, Chris H. Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

25 Scopus citations

Abstract

This paper presents a statistical leakage estimation method for FinFET devices considering the unique width quantization property. Monte Carlo simulations show that the conventional approach underestimates the average leakage current of FinFET devices by as much as 43% while the proposed approach gives a precise estimation with an error less than 5%. Design example on dynamic logic circuits shows the effectiveness of the proposed method.

Original languageEnglish (US)
Title of host publicationProceedings of the IEEE 2006 Custom Integrated Circuits Conference, CICC 2006
Pages337-340
Number of pages4
DOIs
StatePublished - Dec 1 2006
EventIEEE 2006 Custom Integrated Circuits Conference, CICC 2006 - San Jose, CA, United States
Duration: Sep 10 2006Sep 13 2006

Publication series

NameProceedings of the Custom Integrated Circuits Conference
ISSN (Print)0886-5930

Conference

ConferenceIEEE 2006 Custom Integrated Circuits Conference, CICC 2006
CountryUnited States
CitySan Jose, CA
Period9/10/069/13/06

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    Gu, J., Keane, J., Sapatnekar, S. S., & Kim, C. H. (2006). Width quantization aware FinFET circuit design. In Proceedings of the IEEE 2006 Custom Integrated Circuits Conference, CICC 2006 (pp. 337-340). [4114973] (Proceedings of the Custom Integrated Circuits Conference). https://doi.org/10.1109/CICC.2006.320916