Width quantization aware FinFET circuit design

Jie Gu; John Keane; Sachin S Sapatnekar; Chris H. Kim

doi:10.1109/CICC.2006.320916

Width quantization aware FinFET circuit design

Jie Gu, John Keane, Sachin S Sapatnekar, Chris H. Kim

Electrical and Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

32 Scopus citations

Abstract

This paper presents a statistical leakage estimation method for FinFET devices considering the unique width quantization property. Monte Carlo simulations show that the conventional approach underestimates the average leakage current of FinFET devices by as much as 43% while the proposed approach gives a precise estimation with an error less than 5%. Design example on dynamic logic circuits shows the effectiveness of the proposed method.

Original language	English (US)
Title of host publication	Proceedings of the IEEE 2006 Custom Integrated Circuits Conference, CICC 2006
Pages	337-340
Number of pages	4
DOIs	https://doi.org/10.1109/CICC.2006.320916
State	Published - Dec 1 2006
Event	IEEE 2006 Custom Integrated Circuits Conference, CICC 2006 - San Jose, CA, United States Duration: Sep 10 2006 → Sep 13 2006

Publication series

Name	Proceedings of the Custom Integrated Circuits Conference
ISSN (Print)	0886-5930

Conference

Conference	IEEE 2006 Custom Integrated Circuits Conference, CICC 2006
Country/Territory	United States
City	San Jose, CA
Period	9/10/06 → 9/13/06

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10.1109/CICC.2006.320916

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Gu, J, Keane, J, Sapatnekar, SS & Kim, CH 2006, Width quantization aware FinFET circuit design. in Proceedings of the IEEE 2006 Custom Integrated Circuits Conference, CICC 2006., 4114973, Proceedings of the Custom Integrated Circuits Conference, pp. 337-340, IEEE 2006 Custom Integrated Circuits Conference, CICC 2006, San Jose, CA, United States, 9/10/06. https://doi.org/10.1109/CICC.2006.320916

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abstract = "This paper presents a statistical leakage estimation method for FinFET devices considering the unique width quantization property. Monte Carlo simulations show that the conventional approach underestimates the average leakage current of FinFET devices by as much as 43% while the proposed approach gives a precise estimation with an error less than 5%. Design example on dynamic logic circuits shows the effectiveness of the proposed method.",

author = "Jie Gu and John Keane and Sapatnekar, {Sachin S} and Kim, {Chris H.}",

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AU - Sapatnekar, Sachin S

AU - Kim, Chris H.

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N2 - This paper presents a statistical leakage estimation method for FinFET devices considering the unique width quantization property. Monte Carlo simulations show that the conventional approach underestimates the average leakage current of FinFET devices by as much as 43% while the proposed approach gives a precise estimation with an error less than 5%. Design example on dynamic logic circuits shows the effectiveness of the proposed method.

AB - This paper presents a statistical leakage estimation method for FinFET devices considering the unique width quantization property. Monte Carlo simulations show that the conventional approach underestimates the average leakage current of FinFET devices by as much as 43% while the proposed approach gives a precise estimation with an error less than 5%. Design example on dynamic logic circuits shows the effectiveness of the proposed method.

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ER -

Width quantization aware FinFET circuit design

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