What happens when circuits grow old: Aging issues in CMOS design

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Scopus citations

Abstract

As CMOS technologies have shrunk to tens of nanometers, aging problems have emerged as a major challenge. There has been tremendous progress in developing new methods for modeling and diagnosing reliability at the level of individual transistors, but much less work on propagating these models to higher levels of abstraction to analyze and optimize the reliability of larger circuits. This talk will provide an introduction to various circuit aging mechanisms and will then discuss research that develops computer-aided design techniques for estimating and enhancing the reliability of large digital circuits, examining solutions that could practically be applied to analyze or improve the lifetime of a design while maintaining consistency to accurate device-level models and the associated physics.

Original languageEnglish (US)
Title of host publication2013 International Symposium on VLSI Technology, Systems and Application, VLSI-TSA 2013
DOIs
StatePublished - 2013
Event2013 International Symposium on VLSI Technology, Systems and Application, VLSI-TSA 2013 - Hsinchu, Taiwan, Province of China
Duration: Apr 22 2013Apr 24 2013

Publication series

Name2013 International Symposium on VLSI Technology, Systems and Application, VLSI-TSA 2013

Other

Other2013 International Symposium on VLSI Technology, Systems and Application, VLSI-TSA 2013
CountryTaiwan, Province of China
CityHsinchu
Period4/22/134/24/13

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  • Cite this

    Sapatnekar, S. S. (2013). What happens when circuits grow old: Aging issues in CMOS design. In 2013 International Symposium on VLSI Technology, Systems and Application, VLSI-TSA 2013 [6545621] (2013 International Symposium on VLSI Technology, Systems and Application, VLSI-TSA 2013). https://doi.org/10.1109/VLSI-TSA.2013.6545621