Weak antilocalization and low-temperature characterization of sputtered polycrystalline bismuth selenide

Keyphrases

• Magnetoresistance 100%
• Weak Localization 100%
• Low Mobility 100%
• Bismuth Telluride 100%
• Low Temperature Characterization 100%
• Low Temperature 50%
• High Field 50%
• Temperature-dependent Thermal Conductivity 50%
• Transport Measurements 50%
• Transmission Electron Microscopy 50%
• Impurities 50%
• Electron-electron Interaction 50%
• Silicon Substrate 50%
• Polycrystalline Structure 50%
• Selected Area Electron Diffraction 50%
• Angular Dependence 50%
• Crystallographic Characterization 50%
• Grain Structure 50%
• Transport Characterization 50%
• High Carrier Concentration 50%
• Electron-electron Scattering 50%
• Phase Coherence Length 50%
• Interaction Theory 50%
• Semiconducting Behavior 50%
• Phase Decoherence 50%

Material Science

• Silicon 100%
• Film 100%
• Carrier Concentration 100%
• Magnetoresistance 100%
• Crystal Microstructure 100%
• Transmission Electron Microscopy 100%
• Selected Area Diffraction 100%
• Bismuth 100%
• Crystal Structure 100%

Physics

• Polycrystalline 100%
• Selenide 100%
• Electron Scattering 66%
• Magnetoresistance 33%
• Transmission Electron Microscopy 33%
• Phase Coherence 33%
• Electron Diffraction 33%