Abstract
Many of the candidate fluids for immersion cooling of microelectronic components possess both low surface tension and high gas solubility. As a consequence, ebullient heat transfer with such fluids is accompanied by nucleation anomalies and a frequently observed wall temperature overshoot. The difficulty in preventing this thermal excursion and in predicting its magnitude constrains the development of immersion cooling systems. This paper begins with a brief review of the mechanisms that may be responsible for delayed nucleation and examines the limited literature on incipience superheat excursions.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 19-31 |
| Number of pages | 13 |
| Journal | Heat Transfer Engineering |
| Volume | 9 |
| Issue number | 3 |
| DOIs | |
| State | Published - Jun 1988 |
Bibliographical note
Funding Information:This study was supported in part by a grant from the Commercial Chemicals Division of the 3M Company. The authors are grateful to Mr. Wei Tong for his aid in the revision of the manuscript.