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Wafer-scale packaging for FBAR-based oscillators

  • Martha Small
  • , Rich Ruby
  • , Steven Ortiz
  • , Reed Parker
  • , Fan Zhang
  • , Jianlei Shi
  • , Brian Otis

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Recent advances in temperature-compensation for FBAR (Film Bulk Acoustic Resonators) have brought this technology forward as a serious contender in the oscillator marketplace. As with any mechanical resonator oscillator, a cost-effective hermetic package combined with circuit technology are critical for commercial application. Billions of FBAR duplexers have been fabricated using Avago Technologies' wafer-scale packaging process, whereby a silicon lid wafer is Au-diffusion-bonded to a base FBAR wafer to make a robust, hermetic package. This paper presents a method for integrating circuitry into the lid wafer to form a sub-0.1 mm3, sub mW, 1.5 GHz temperature-compensated chip-scale oscillator. Circuit integration, testing and performance will be discussed.

Original languageEnglish (US)
Title of host publication2011 Joint Conference of the IEEE International Frequency Control Symposium and European Frequency and Time Forum, IFCS/EFTF 2011 - Proceedings
DOIs
StatePublished - 2011
Externally publishedYes
Event5th Joint Conference of the 65th IEEE International Frequency Control Symposium, IFCS 2011 and 25th European Frequency and Time Forum, EFTF 2011 - San Fransisco, CA, United States
Duration: May 1 2011May 5 2011

Publication series

NameProceedings of the IEEE International Frequency Control Symposium and Exposition

Other

Other5th Joint Conference of the 65th IEEE International Frequency Control Symposium, IFCS 2011 and 25th European Frequency and Time Forum, EFTF 2011
Country/TerritoryUnited States
CitySan Fransisco, CA
Period5/1/115/5/11

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