Wafer-scale high- k SrTiO3 dielectrics with rational barrier-layer design for low leakage and high charge density

Majid Mohseni
, Shivasheesh Varshney
, Seung Gyo Jeong
, Amber Walton
, C. Daniel Frisbie
, Bharat Jalan

Research output: Contribution to journal › Article › peer-review

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University of Minnesota Materials Research Science and Engineering Center (DMR-2011401)
Bates, F. S. (PI), Calabrese, M. A. (PI), Ellison, C. J. (PI), Ferry, V. E. (PI), Flannigan, D. J. (PI), Frisbie, D. (PI), Frontiera, R. R. (PI), Greven, M. (PI), Haynes, C. L. (PI), Head-Marsden, K. M. (PI), Ilic, O. (PI), Jalan, B. (PI), Lamb, J. R. (PI), Leighton, C. (PI), Lodge, T. (PI), Low, T. (PI), Mahanthappa, M. (PI), Mkhoyan, A. (PI), Reineke, T. M. (PI), Roman, A. J. (PI), Sarupria, S. (PI), Stoerzinger, K. A. (PI), Walker, L. M. (PI), Wang, X. (PI), Xiong, B. (PI), Holmes, R. J. (Key Personnel), Oh, S.-H. (Key Personnel), Martiniani, S. (Prior Principal Investigator) & Wang, K. (Prior Principal Investigator)
THE NATIONAL SCIENCE FOUNDATION
9/1/20 → 8/31/27
Project: Research project