Visible and X-ray spectroscopy studies of defects in CdTe

A. Gupta; A. D. Compaan; K. Price; A. Vasko; K. Hinko; X. Liu; M. Fritts; N. Leyarovska; J. Terry

Visible and X-ray spectroscopy studies of defects in CdTe

A. Gupta, A. D. Compaan, K. Price, A. Vasko, K. Hinko, X. Liu, M. Fritts, N. Leyarovska, J. Terry

Physics and Astronomy (Twin Cities)

Research output: Contribution to journal › Conference article › peer-review

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Abstract

We have used electroluminescence (EL), photoluminesence (PL), and synchrotron x-ray fluorescence (XRF) to study some of the properties of defects related to Cu and Na in polycrystalline thin films of CdTe. Some samples were prepared by ion implantation of CdTe single crystals followed by thermal anneal to remove the damage. Others were prepared by magnetron sputtering on quartz or borosilicate glass followed by vapor CdCl₂ heat treatment. EL was studied from sputtered CdS/CdTe solar cell structures. We find that EL is very sensitive to defects induced by light soaking; ion implantation-induced damage can be annealed at 400 C to yield good PL; and synchrotron XRF shows the presence of substantial copper in films sputtered from nominally pure CdTe.

Original language	English (US)
Pages (from-to)	492-495
Number of pages	4
Journal	Conference Record of the IEEE Photovoltaic Specialists Conference
State	Published - Dec 1 2002
Event	29th IEEE Photovoltaic Specialists Conference - New Orleans, LA, United States Duration: May 19 2002 → May 24 2002

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title = "Visible and X-ray spectroscopy studies of defects in CdTe",

abstract = "We have used electroluminescence (EL), photoluminesence (PL), and synchrotron x-ray fluorescence (XRF) to study some of the properties of defects related to Cu and Na in polycrystalline thin films of CdTe. Some samples were prepared by ion implantation of CdTe single crystals followed by thermal anneal to remove the damage. Others were prepared by magnetron sputtering on quartz or borosilicate glass followed by vapor CdCl2 heat treatment. EL was studied from sputtered CdS/CdTe solar cell structures. We find that EL is very sensitive to defects induced by light soaking; ion implantation-induced damage can be annealed at 400 C to yield good PL; and synchrotron XRF shows the presence of substantial copper in films sputtered from nominally pure CdTe.",

author = "A. Gupta and Compaan, {A. D.} and K. Price and A. Vasko and K. Hinko and X. Liu and M. Fritts and N. Leyarovska and J. Terry",

year = "2002",

month = dec,

day = "1",

language = "English (US)",

pages = "492--495",

journal = "Conference Record of the IEEE Photovoltaic Specialists Conference",

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publisher = "Institute of Electrical and Electronics Engineers Inc.",

note = "29th IEEE Photovoltaic Specialists Conference ; Conference date: 19-05-2002 Through 24-05-2002",

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TY - JOUR

T1 - Visible and X-ray spectroscopy studies of defects in CdTe

AU - Gupta, A.

AU - Compaan, A. D.

AU - Price, K.

AU - Vasko, A.

AU - Hinko, K.

AU - Liu, X.

AU - Fritts, M.

AU - Leyarovska, N.

AU - Terry, J.

PY - 2002/12/1

Y1 - 2002/12/1

N2 - We have used electroluminescence (EL), photoluminesence (PL), and synchrotron x-ray fluorescence (XRF) to study some of the properties of defects related to Cu and Na in polycrystalline thin films of CdTe. Some samples were prepared by ion implantation of CdTe single crystals followed by thermal anneal to remove the damage. Others were prepared by magnetron sputtering on quartz or borosilicate glass followed by vapor CdCl2 heat treatment. EL was studied from sputtered CdS/CdTe solar cell structures. We find that EL is very sensitive to defects induced by light soaking; ion implantation-induced damage can be annealed at 400 C to yield good PL; and synchrotron XRF shows the presence of substantial copper in films sputtered from nominally pure CdTe.

AB - We have used electroluminescence (EL), photoluminesence (PL), and synchrotron x-ray fluorescence (XRF) to study some of the properties of defects related to Cu and Na in polycrystalline thin films of CdTe. Some samples were prepared by ion implantation of CdTe single crystals followed by thermal anneal to remove the damage. Others were prepared by magnetron sputtering on quartz or borosilicate glass followed by vapor CdCl2 heat treatment. EL was studied from sputtered CdS/CdTe solar cell structures. We find that EL is very sensitive to defects induced by light soaking; ion implantation-induced damage can be annealed at 400 C to yield good PL; and synchrotron XRF shows the presence of substantial copper in films sputtered from nominally pure CdTe.

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UR - http://www.scopus.com/inward/citedby.url?scp=0036948637&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:0036948637

SN - 0160-8371

SP - 492

EP - 495

JO - Conference Record of the IEEE Photovoltaic Specialists Conference

JF - Conference Record of the IEEE Photovoltaic Specialists Conference

T2 - 29th IEEE Photovoltaic Specialists Conference

Y2 - 19 May 2002 through 24 May 2002

ER -

Visible and X-ray spectroscopy studies of defects in CdTe

Abstract

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