VARIUS-NTV: A microarchitectural model to capture the increased sensitivity of manycores to process variations at near-threshold voltages

Ulya R. Karpuzcu, Krishna B. Kolluru, Nam Sung Kim, Josep Torrellas

Research output: Chapter in Book/Report/Conference proceedingConference contribution

60 Scopus citations

Abstract

Near-Threshold Computing (NTC), where the supply voltage is only slightly higher than the threshold voltage of transistors, is a promising approach to attain energy-efficient computing. Unfortunately, compared to the conventional Super-Threshold Computing (STC), NTC is more sensitive to process variations, which results in higher power consumption and lower frequencies than would otherwise be possible, and potentially a non-negligible fault rate. To help address variations at NTC at the architecture level, this paper presents the first microarchitectural model of process variations for NTC. The model, called VARIUS-NTV, extends the existing VARIUS variation model. Its key aspects include: (i) adopting a gate-delay model and an SRAM cell type that are tailored to NTC, (ii) modeling SRAM failure modes emerging at NTC, and (iii) accounting for the impact of leakage in SRAM models. We evaluate a simulated 11nm, 288-core tiled manycore at both NTC and STC. The results show higher frequency and power variations within the NTC chip. For example, the maximum difference in on-chip tile frequency is 2.3× at STC and 3.7× at NTC. We also validate our model against an experimental chip.

Original languageEnglish (US)
Title of host publication2012 42nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2012
DOIs
StatePublished - Oct 1 2012
Event42nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2012 - Boston, MA, United States
Duration: Jun 25 2012Jun 28 2012

Publication series

NameProceedings of the International Conference on Dependable Systems and Networks

Other

Other42nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2012
CountryUnited States
CityBoston, MA
Period6/25/126/28/12

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Keywords

  • Manycore architectures
  • Near-threshold voltage
  • Power constraints
  • Process variations
  • SRAM fault models

Cite this

Karpuzcu, U. R., Kolluru, K. B., Kim, N. S., & Torrellas, J. (2012). VARIUS-NTV: A microarchitectural model to capture the increased sensitivity of manycores to process variations at near-threshold voltages. In 2012 42nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2012 [6263951] (Proceedings of the International Conference on Dependable Systems and Networks). https://doi.org/10.1109/DSN.2012.6263951