Keyphrases
Circuit Degradation
100%
Circuit Delay
20%
Dynamic Scaling
20%
Leakage Power
60%
Leakage Power Analysis
20%
Negative Bias Temperature Instability
100%
Power Increase
20%
Process Variation
20%
Scaling Technique
80%
Statistical Timing
20%
Supply Voltage Assignment
100%
Time Node
20%
Variation-aware
100%
Voltage Scaling
20%
Vth Variation
20%
Engineering
Circuit Designer
20%
Delay Circuits
20%
Experimental Result
20%
Negative-Bias Temperature Instability
100%
Nodes
20%
Process Variation
20%
Scale Dynamic
20%
Supply Voltage
100%
Voltage Scaling
20%
Computer Science
Experimental Result
25%
Growing Process
25%
Power Analysis
25%
Process Variation
25%
Reliability Concern
25%
Scaling Technique
100%
Supply Voltage
100%