Variation-aware speed binning of multi-core processors

John Sartori, Aashish Pant, Rakesh Kumar, Puneet Gupta

Research output: Chapter in Book/Report/Conference proceedingConference contribution

22 Scopus citations

Abstract

Number of cores per multi-core processor die, as well as variation between the maximum operating frequency of individual cores, is rapidly increasing. This makes performance binning of multi-core processors a non-trivial task. In this paper, we study, for the first time, multi-core binning metrics and strategies to evaluate them efficiently. We discuss two multi-core binning metrics with high correlation to processor throughput for different types of workloads and different process variation scenarios. More importantly, we demonstrate the importance of leveraging variation model data in the binning process to significantly reduce the binning overhead with a negligible loss in binning quality. For example, we demonstrate that the performance binning overhead of a 64-core processor can be decreased by 51% and 36% using the proposed variation-aware core clustering and curve fitting strategies respectively. Experiments were performed using a manufacturing variation model based on real 65nm silicon data.

Original languageEnglish (US)
Title of host publicationProceedings of the 11th International Symposium on Quality Electronic Design, ISQED 2010
Pages307-314
Number of pages8
DOIs
StatePublished - May 28 2010
Event11th International Symposium on Quality Electronic Design, ISQED 2010 - San Jose, CA, United States
Duration: Mar 22 2010Mar 24 2010

Publication series

NameProceedings of the 11th International Symposium on Quality Electronic Design, ISQED 2010

Other

Other11th International Symposium on Quality Electronic Design, ISQED 2010
CountryUnited States
CitySan Jose, CA
Period3/22/103/24/10

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Keywords

  • Binning
  • Multi-core
  • Performance
  • Process variations

Cite this

Sartori, J., Pant, A., Kumar, R., & Gupta, P. (2010). Variation-aware speed binning of multi-core processors. In Proceedings of the 11th International Symposium on Quality Electronic Design, ISQED 2010 (pp. 307-314). [5450442] (Proceedings of the 11th International Symposium on Quality Electronic Design, ISQED 2010). https://doi.org/10.1109/ISQED.2010.5450442