Use of High Lateral Resolution Secondary Ion Mass Spectrometry To Characterize Self-Assembled Monolayers on Microfabricated Structures

C. Daniel Frisbie, John R. Martin, Ronald R. Duff, Mark S. Wrighton

Research output: Contribution to journalArticlepeer-review

47 Scopus citations

Fingerprint

Dive into the research topics of 'Use of High Lateral Resolution Secondary Ion Mass Spectrometry To Characterize Self-Assembled Monolayers on Microfabricated Structures'. Together they form a unique fingerprint.

Medicine & Life Sciences

Engineering & Materials Science

Chemical Compounds