Keyphrases
Parameter Dependence
100%
Combinational Logic
100%
Soft Error
100%
Soft Error Rate
50%
First-order
25%
Varying Length
25%
Chain Length
25%
Portability
25%
Supply Voltage
25%
Capacitance
25%
CMOS Technology
25%
Threshold Voltage
25%
Channel Width
25%
Technology Node
25%
Array-based
25%
Planar CMOS
25%
Complex Interplay
25%
Logic Gates
25%
Neutron Irradiation
25%
Channel Limits
25%
Multiple Supply Voltage
25%
Neutron Radiation
25%
Circuit Parameters
25%
Error Characterization
25%
Fin Field-effect Transistor (FinFET)
25%
Advanced CMOS
25%
Easy Process
25%
Logic Chain
25%
Radiation-induced Soft Errors
25%
Near-threshold
25%
High-density Array
25%
Engineering
Key Parameter
100%
Soft Error
100%
Nodes
50%
Supply Voltage
33%
Error Rate
33%
Test Structure
16%
Logic Gate
16%
Circuit Parameter
16%
Irradiation Data
16%
Cross Section
16%