Ultrasmall grain size control in longitudinal recording media for ultrahigh areal densities

S. N. Piramanayagam, Y. F. Xu, D. Y. Dai, L. Huang, S. I. Pang, J. P. Wang

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Abstract

In this study, we propose a new "atomic wall" approach to underlayer design. In this design, a CrX underlayer is used where X and Cr are not miscible in the bulk phase, resulting in a reduced grain size. We have studied the addition of Zr to Cr layers and found that CrZr gives magnetic properties comparable to those of CrMo underlayers. In addition, a CrZr underlayer gives rise to a smaller grain size of 5.5 nm, in comparison to a grain size of 6.2 nm in the case of CrMo underlayers. To our knowledge, this is the smallest grain size reported for Co-alloy recording media. The recording measurements also show a higher signal to noise ratio for CrZr underlayers than for CrMo underlayers, suggesting that CrZr underlayers have potential for use in ultrahigh areal densities.

Original languageEnglish (US)
Pages (from-to)7685-7687
Number of pages3
JournalJournal of Applied Physics
Volume91
Issue number10 I
DOIs
StatePublished - May 15 2002

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