Abstract
We have carried out an ultrahigh-field cyclotron resonance study of n-type In1-xMnxAs films, with Mn composition x ranging from 0% to 12%, grown on GaAs by low-temperature molecular-beam epitaxy. We observe that the electron cyclotron resonance peak shifts to lower field with increasing x. A detailed comparison of experimental results with calculations based on a modified Pidgeon-Brown model allows us to estimate the s-d and p-d exchange-coupling constants, α and β, for this important III-V dilute magnetic semiconductor system.
Original language | English (US) |
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Article number | 161307 |
Pages (from-to) | 1613071-1613074 |
Number of pages | 4 |
Journal | Physical Review B - Condensed Matter and Materials Physics |
Volume | 66 |
Issue number | 16 |
DOIs | |
State | Published - Oct 15 2002 |