Ultrahigh field electron cyclotron resonance absorption in In1-xMnxAs films

M. A. Zudov, J. Kono, Y. H. Matsuda, T. Ikaida, N. Miura, H. Munekata, G. D. Sanders, Y. Sun, C. J. Stanton

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Abstract

We have carried out an ultrahigh-field cyclotron resonance study of n-type In1-xMnxAs films, with Mn composition x ranging from 0% to 12%, grown on GaAs by low-temperature molecular-beam epitaxy. We observe that the electron cyclotron resonance peak shifts to lower field with increasing x. A detailed comparison of experimental results with calculations based on a modified Pidgeon-Brown model allows us to estimate the s-d and p-d exchange-coupling constants, α and β, for this important III-V dilute magnetic semiconductor system.

Original languageEnglish (US)
Article number161307
Pages (from-to)1613071-1613074
Number of pages4
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume66
Issue number16
DOIs
StatePublished - Oct 15 2002

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