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Ultrafast terahertz-field-driven ionic response in ferroelectric BaTiO3

  • F. Chen
  • , Y. Zhu
  • , S. Liu
  • , Y. Qi
  • , H. Y. Hwang
  • , Nathaniel C Brandt
  • , J. Lu
  • , F. Quirin
  • , H. Enquist
  • , P. Zalden
  • , T. Hu
  • , J. Goodfellow
  • , M. J. Sher
  • , M. C. Hoffmann
  • , D. Zhu
  • , H. Lemke
  • , J. Glownia
  • , M. Chollet
  • , A. R. Damodaran
  • , J. Park
  • Z. Cai, I. W. Jung, M. J. Highland, D. A. Walko, J. W. Freeland, P. G. Evans, A. Vailionis, J. Larsson, K. A. Nelson, A. M. Rappe, K. Sokolowski-Tinten, L. W. Martin, H. Wen, A. M. Lindenberg

Research output: Contribution to journalArticlepeer-review

Abstract

The dynamical processes associated with electric field manipulation of the polarization in a ferroelectric remain largely unknown but fundamentally determine the speed and functionality of ferroelectric materials and devices. Here we apply subpicosecond duration, single-cycle terahertz pulses as an ultrafast electric field bias to prototypical BaTiO3 ferroelectric thin films with the atomic-scale response probed by femtosecond x-ray-scattering techniques. We show that electric fields applied perpendicular to the ferroelectric polarization drive large-amplitude displacements of the titanium atoms along the ferroelectric polarization axis, comparable to that of the built-in displacements associated with the intrinsic polarization and incoherent across unit cells. This effect is associated with a dynamic rotation of the ferroelectric polarization switching on and then off on picosecond time scales. These transient polarization modulations are followed by long-lived vibrational heating effects driven by resonant excitation of the ferroelectric soft mode, as reflected in changes in the c-axis tetragonality. The ultrafast structural characterization described here enables a direct comparison with first-principles-based molecular-dynamics simulations, with good agreement obtained.

Original languageEnglish (US)
Article number180104
JournalPhysical Review B
Volume94
Issue number18
DOIs
StatePublished - Nov 22 2016
Externally publishedYes

Bibliographical note

Publisher Copyright:
© 2016 American Physical Society.

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