Ultrafast electron microscopy: Instrument response from the single-electron to high bunch-charge regimes

Keyphrases

• Single Electron 100%
• Instrument Response 100%
• Bunch Charge 100%
• Ultrafast Electron Microscopy 100%
• Charging Regimes 100%
• Ultrafast 33%
• Response Time 33%
• Lensing 33%
• Space Images 33%
• Threshold Level 33%
• Graphite 33%
• Negligible Effects 33%
• Photoelectron 33%
• Electron Microscope 33%
• Space Charge Limited 33%
• Space Charge Effect 33%
• LaB6 Cathode 33%
• Fs Laser Pulses 33%
• Thermionic Electron Gun 33%

Physics

• Electron Microscopy 100%
• Space Charge 100%
• Electron Microscope 50%
• Laser Pulse 50%
• Photoelectron 50%
• Thermionics 50%
• Blood Plasma 50%