Ultrafast electron microscopy: Instrument response from the single-electron to high bunch-charge regimes

Dayne A. Plemmons, David J. Flannigan

Research output: Contribution to journalArticlepeer-review

37 Scopus citations

Abstract

We determine the instrument response of an ultrafast electron microscope equipped with a conventional thermionic electron gun and absent modifications beyond the optical ports. Using flat, graphite-encircled LaB6 cathodes, we image space-charge effects as a function of photoelectron-packet population and find that an applied Wehnelt bias has a negligible effect on the threshold levels (>103 electrons per pulse) but does appear to suppress blurring at the upper limits (∼105 electrons). Using plasma lensing, we determine the instrument-response time for 700-fs laser pulses and find that single-electron packets are laser limited (1 ps), while broadening occurs well below the space-charge limit.

Original languageEnglish (US)
Pages (from-to)186-192
Number of pages7
JournalChemical Physics Letters
Volume683
DOIs
StatePublished - Sep 1 2017

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Publisher Copyright:
© 2017 Elsevier B.V.

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