Keyphrases
Conductivity Measurement
100%
Doped Layers
100%
D″ Layer
100%
H Coverage
100%
High Density
100%
Low Temperature
100%
Low-temperature Characteristics
100%
Microscope Image
100%
Molecular Precursor
100%
PH 3
100%
Phosphorus Doping
100%
Quantum Computation
100%
Room Temperature
100%
Scanning Tunneling Microscope
100%
Si Epitaxy
100%
Surface Coverage
100%
Two-dimensional Conductor
100%
Ultra-dense
100%
Engineering
Conductivity Measurement
50%
Future Application
50%
Low-Temperature
100%
Quantum Computation
50%
Room Temperature
50%
Scanning Tunneling Microscope
50%
Surface Coverage
50%
Two Dimensional
50%
Physics
Epitaxy
100%
Quantum Computing
100%
Room Temperature
100%
Temperature Characteristics
100%
Material Science
Conductor
50%
Density
50%
Epitaxy
50%
Silicon
100%
Surface (Surface Science)
50%