Tutorial: Optimization and analysis techniques for the deep submicron regime

N. Menezes; S. Sapatnekar

Tutorial: Optimization and analysis techniques for the deep submicron regime

N. Menezes
, S. Sapatnekar

Electrical and Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Scaling in the deep submicron (DSM) regime has fundamentally altered the primary issues affecting VLSI design. Logical-physical codesign is essential with great dependence between logic-level optimizations and the actual physical design. The problems encountered in the DSM design and the computer aided design (CAD) strategies used to overcome them were discussed.

Original language	English (US)
Title of host publication	Proceedings of the IEEE International Conference on VLSI Design
Pages	3-4
Number of pages	2
State	Published - Jan 1 2001
Event	14th International Conference on VLSI Design (VLSI DESIGN 2001) - Bangalore, India Duration: Jan 3 2001 → Jan 7 2001

Other

Other	14th International Conference on VLSI Design (VLSI DESIGN 2001)
Country/Territory	India
City	Bangalore
Period	1/3/01 → 1/7/01

Find It

Find It at U of M Libraries

Cite this

@inproceedings{e13ecefab03f4b58823619549890ba78,

title = "Tutorial: Optimization and analysis techniques for the deep submicron regime",

abstract = "Scaling in the deep submicron (DSM) regime has fundamentally altered the primary issues affecting VLSI design. Logical-physical codesign is essential with great dependence between logic-level optimizations and the actual physical design. The problems encountered in the DSM design and the computer aided design (CAD) strategies used to overcome them were discussed.",

author = "N. Menezes and S. Sapatnekar",

year = "2001",

month = jan,

day = "1",

language = "English (US)",

pages = "3--4",

booktitle = "Proceedings of the IEEE International Conference on VLSI Design",

note = "14th International Conference on VLSI Design (VLSI DESIGN 2001) ; Conference date: 03-01-2001 Through 07-01-2001",

}

TY - GEN

T1 - Tutorial

T2 - 14th International Conference on VLSI Design (VLSI DESIGN 2001)

AU - Menezes, N.

AU - Sapatnekar, S.

PY - 2001/1/1

Y1 - 2001/1/1

N2 - Scaling in the deep submicron (DSM) regime has fundamentally altered the primary issues affecting VLSI design. Logical-physical codesign is essential with great dependence between logic-level optimizations and the actual physical design. The problems encountered in the DSM design and the computer aided design (CAD) strategies used to overcome them were discussed.

AB - Scaling in the deep submicron (DSM) regime has fundamentally altered the primary issues affecting VLSI design. Logical-physical codesign is essential with great dependence between logic-level optimizations and the actual physical design. The problems encountered in the DSM design and the computer aided design (CAD) strategies used to overcome them were discussed.

UR - https://www.scopus.com/pages/publications/0034995967

UR - https://www.scopus.com/pages/publications/0034995967#tab=citedBy

M3 - Conference contribution

AN - SCOPUS:0034995967

SP - 3

EP - 4

BT - Proceedings of the IEEE International Conference on VLSI Design

Y2 - 3 January 2001 through 7 January 2001

ER -

Tutorial: Optimization and analysis techniques for the deep submicron regime

Abstract

Other

Find It

Other files and links

Fingerprint

Cite this