True Random Number Generator circuits based on single- and multi-phase beat frequency detection

Qianying Tang, Bongjin Kim, Yingjie Lao, Keshab K Parhi, Chris H. Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

35 Scopus citations

Abstract

A fully-digital True Random Number Generator (TRNG) measures the frequency difference between two free-running ring oscillators, or in other words the beat frequency, to extract random frequency jitter. For generating a continuous stream of random bits with a high entropy level, the lower significant bits meeting the NIST randomness criteria are concatenated. The generation efficiency is further improved by utilizing a multi-phase structure. The proposed circuit fabricated in 65nm achieves an energy efficiency of 15.1Mb/mW at 0.8V. Experimental data collected from eight TRNG test chips passed all 15 NIST tests without the use of any feedback or tracking scheme.

Original languageEnglish (US)
Title of host publicationProceedings of the IEEE 2014 Custom Integrated Circuits Conference, CICC 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781479932863
DOIs
StatePublished - Nov 4 2014
Event36th Annual Custom Integrated Circuits Conference - The Showcase for Integrated Circuit Design in the Heart of Silicon Valley, CICC 2014 - San Jose, United States
Duration: Sep 15 2014Sep 17 2014

Publication series

NameProceedings of the IEEE 2014 Custom Integrated Circuits Conference, CICC 2014

Other

Other36th Annual Custom Integrated Circuits Conference - The Showcase for Integrated Circuit Design in the Heart of Silicon Valley, CICC 2014
CountryUnited States
CitySan Jose
Period9/15/149/17/14

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