Abstract
Ultrathin films of Sn have been grown incrementally on substrates held at 15 K and then studied in situ at low temperatures. This process of repeatedly increasing the thickness of a film facilitates the investigation of thickness-dependent physical properties. The superconducting transition temperature has been found to oscillate with a period which was nominally about 4. The latter is approximately a factor of 2 larger than the prediction of simple theoretical models. Oscillations of the normal-state resistance with thickness have not been observed.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 2046-2049 |
| Number of pages | 4 |
| Journal | Physical Review Letters |
| Volume | 53 |
| Issue number | 21 |
| DOIs | |
| State | Published - Jan 1 1984 |