Abstract
Ultrathin films of Sn have been grown incrementally on substrates held at 15 K and then studied in situ at low temperatures. This process of repeatedly increasing the thickness of a film facilitates the investigation of thickness-dependent physical properties. The superconducting transition temperature has been found to oscillate with a period which was nominally about 4. The latter is approximately a factor of 2 larger than the prediction of simple theoretical models. Oscillations of the normal-state resistance with thickness have not been observed.
Original language | English (US) |
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Pages (from-to) | 2046-2049 |
Number of pages | 4 |
Journal | Physical Review Letters |
Volume | 53 |
Issue number | 21 |
DOIs | |
State | Published - Jan 1 1984 |