TRANSIENT SUBSTRATE CURRENT GENERATION AND DEVICE DEGRADATION IN CMOS CIRCUITS AT 77 K.

Keyphrases

• CMOS Circuits 100%
• Circuit Performance 100%
• CMOS Devices 100%
• Device Degradation 100%
• Substrate Current 100%
• Pulse Stress 100%
• Device Characteristics 50%
• Stress Conditions 50%
• Hot Carriers 50%
• Characteristic Performance 50%
• Hot Carrier Effect 50%
• CMOS Inverter 50%
• Pulse Input 50%
• Conventional Sources 50%

Engineering

• Circuit Performance 100%
• Cmos Circuit 100%
• Stress Condition 50%
• Carrier Effect 50%
• Inverter 50%

Material Science

• Electronic Circuit 100%
• Hot Carrier 66%