Transient-signal-based sample-detection in atomic force microscopy

Deepak R. Sahoo, Abu Sebastian, Murti V. Salapaka

Research output: Contribution to journalArticlepeer-review

61 Scopus citations

Abstract

The use of steady state signals for detecting imaging materials during the operation of atomic force microscopes was analyzed. A methodology that exploits the deflection signal during the transient of the cantilever motion was presented. The bandwidth was found to be independent of the quality factor and was determined by the resonant frequency of the cantilever. The method overcomes the existing fundamental limitations on the trade off between resolution and bandwidth and makes it independent of the quality factor.

Original languageEnglish (US)
Pages (from-to)5521-5523
Number of pages3
JournalApplied Physics Letters
Volume83
Issue number26
DOIs
StatePublished - Dec 29 2003
Externally publishedYes

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