Abstract
The use of steady state signals for detecting imaging materials during the operation of atomic force microscopes was analyzed. A methodology that exploits the deflection signal during the transient of the cantilever motion was presented. The bandwidth was found to be independent of the quality factor and was determined by the resonant frequency of the cantilever. The method overcomes the existing fundamental limitations on the trade off between resolution and bandwidth and makes it independent of the quality factor.
Original language | English (US) |
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Pages (from-to) | 5521-5523 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 83 |
Issue number | 26 |
DOIs | |
State | Published - Dec 29 2003 |
Externally published | Yes |