Transient-signal-based sample-detection in atomic force microscopy

Deepak R. Sahoo; Abu Sebastian; Murti V. Salapaka

doi:10.1063/1.1633963

Transient-signal-based sample-detection in atomic force microscopy

Deepak R. Sahoo, Abu Sebastian, Murti V. Salapaka

Research output: Contribution to journal › Article › peer-review

61 Scopus citations

Abstract

The use of steady state signals for detecting imaging materials during the operation of atomic force microscopes was analyzed. A methodology that exploits the deflection signal during the transient of the cantilever motion was presented. The bandwidth was found to be independent of the quality factor and was determined by the resonant frequency of the cantilever. The method overcomes the existing fundamental limitations on the trade off between resolution and bandwidth and makes it independent of the quality factor.

Original language	English (US)
Pages (from-to)	5521-5523
Number of pages	3
Journal	Applied Physics Letters
Volume	83
Issue number	26
DOIs	https://doi.org/10.1063/1.1633963
State	Published - Dec 29 2003
Externally published	Yes

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abstract = "The use of steady state signals for detecting imaging materials during the operation of atomic force microscopes was analyzed. A methodology that exploits the deflection signal during the transient of the cantilever motion was presented. The bandwidth was found to be independent of the quality factor and was determined by the resonant frequency of the cantilever. The method overcomes the existing fundamental limitations on the trade off between resolution and bandwidth and makes it independent of the quality factor.",

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