Transient force atomic force microscopy: A new nano-interrogation method

Deepak R. Sahoo, Pranav Agarwal, Murti V. Salapaka

Research output: Chapter in Book/Report/Conference proceedingConference contribution

16 Scopus citations

Abstract

Atomic force microscopes (AFMs) are the primary investigation systems at the nanoscale. In existing dynamic mode AFM methods steady-state response of microcantilever is monitored for imaging tip-surface interaction forces at the nano-scale. In these methods microcantilevers with high quality factor are employed for high force sensitivity but at the cost of speed due to dependence on steady-state signals. In this paper, a novel methodology for fast interrogation of material that exploits the transient part of the cantilever response is presented. This method effectively addresses the perceived fundamental limitation on bandwidth due to high quality factors. Analysis and experiments show that the method results in significant increase in bandwidth and resolution as compared to the steady-state-based methods. This paper demonstrates the effectiveness of a systems perspective to the field of imaging at the nano-scale and for the first time reports real-time imaging at the nanoscale using the transient method with scan speed 40 times faster than conventional methods.

Original languageEnglish (US)
Title of host publicationProceedings of the 2007 American Control Conference, ACC
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages2135-2140
Number of pages6
ISBN (Print)1424409888, 9781424409884
DOIs
StatePublished - 2007
Event2007 American Control Conference, ACC - New York, NY, United States
Duration: Jul 9 2007Jul 13 2007

Publication series

NameProceedings of the American Control Conference
ISSN (Print)0743-1619

Other

Other2007 American Control Conference, ACC
CountryUnited States
CityNew York, NY
Period7/9/077/13/07

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