Topography detection using innovations mismatch method for high speed and high density dynamic mode AFM

Sayan Ghosal, Govind Saraswat, Aditya Ramamoorthy, Murti Salapaka

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

The atomic force microscope (AFM) is one of the major advances in recent science that has enabled imaging of samples at the nanometer scale. Over the years, different techniques have been developed to improve the speed, resolution and accuracy of imaging using AFM. As AFMs can scan and deform material with extremely high resolution, it has also been used as a data read-write system where the high or low topography of the sample surface are interpreted as a one or a zero bit. Data storage using this method can produce extremely high data storage density. In this paper a new method called the innovations mismatch method (IM) is developed that can be used for both imaging and data storage applications. The IM scheme utilizes the dynamic mode of operation and therefore is applicable to soft matter interrogation. In this work, IM method is shown to outperform previously developed techniques.

Original languageEnglish (US)
Title of host publication2013 American Control Conference, ACC 2013
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages5500-5505
Number of pages6
ISBN (Print)9781479901777
DOIs
StatePublished - 2013
Event2013 1st American Control Conference, ACC 2013 - Washington, DC, United States
Duration: Jun 17 2013Jun 19 2013

Publication series

NameProceedings of the American Control Conference
ISSN (Print)0743-1619

Other

Other2013 1st American Control Conference, ACC 2013
CountryUnited States
CityWashington, DC
Period6/17/136/19/13

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    Ghosal, S., Saraswat, G., Ramamoorthy, A., & Salapaka, M. (2013). Topography detection using innovations mismatch method for high speed and high density dynamic mode AFM. In 2013 American Control Conference, ACC 2013 (pp. 5500-5505). [6580698] (Proceedings of the American Control Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/acc.2013.6580698