Tip-Enhanced Raman Voltammetry: Coverage Dependence and Quantitative Modeling
- Michael Mattei
- , Gyeongwon Kang
- , Guillaume Goubert
- , Dhabih V. Chulhai
- , George C. Schatz
- , Lasse Jensen
- , Richard P. Van Duyne
Research output: Contribution to journal › Article › peer-review
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