TIME AVERAGED AND DYNAMIC VOLTAGE DISTRIBUTIONS IN GUNN DEVICES.

Anand Gopinath, M. S. Hill, P. J. Fentem

Research output: Contribution to conferencePaperpeer-review

Abstract

A technique is outlined for examining time-averaged and dynamic voltage distributions, with sub-micron spatial resolution, using a scanning electron microscope. The technique is applicable to a variety of semiconductor devices, but is illustrated with Gunn devices oscillating around 9 GHz.

Original languageEnglish (US)
StatePublished - Jan 1 1973
Externally publishedYes

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