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Thickness dependence of structural and magnetic properties of FePt films
B. C. Lim, J. S. Chen,
J. P. Wang
Electrical and Computer Engineering
Research output
:
Contribution to journal
›
Article
›
peer-review
19
Scopus citations
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Keyphrases
Magnetic Properties
100%
Structural Properties
100%
FePt
100%
Thickness Dependence
100%
FePt Film
100%
Layer Thickness
60%
Preferred Orientation
60%
Magnetocrystalline Anisotropy
40%
Initial Growth
40%
Growth Layers
40%
X-ray Diffractometer
20%
Out-of-plane Coercivity
20%
Demagnetization Factor
20%
Thin Film Thickness
20%
Superlattice
20%
DC Magnetron Sputtering
20%
Vibrating Sample Magnetometer
20%
Linear Relation
20%
Magnetic Layer
20%
Long-range Ordering
20%
L10 Ordered FePt
20%
Engineering
Layer Thickness
100%
Preferred Orientation
100%
Magnetocrystalline Anisotropy
66%
Magnetron
33%
Thin Films
33%
Coercivity
33%
Demagnetization
33%
Long Range Ordering
33%
Superlattice
33%
Material Science
Magnetic Property
100%
Film
100%
Anisotropy
66%
Superlattice
33%
Film Thickness
33%
Magnetron Sputtering
33%
Magnetometer
33%
Thin Films
33%