Thermally activated magnetization back-hopping based true random number generator in nano-ring magnetic tunnel junctions

Jianying Qin, Xiao Wang, Tao Qu, Caihua Wan, Li Huang, Chenyang Guo, Tian Yu, Hongxiang Wei, Xiufeng Han

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

A true random number generator based on the magnetization backhopping process in nano-ring magnetic tunnel junctions is demonstrated in this work. The impact of environmental temperature (T) and current pulse width (τ) on backhopping is investigated statistically by experiments, micromagnetic simulations, and theoretical analysis. The backhopping probability increases at high T and wide τ, as explained by the combined effect of thermal fluctuation and spin-transfer-torque noise. The magnetoresistance at backhopping is randomly distributed over a large operational current range. This manifestation of backhopping in magnetic tunnel junctions can be used as the basic unit of a true random number generator.

Original languageEnglish (US)
Article number112401
JournalApplied Physics Letters
Volume114
Issue number11
DOIs
StatePublished - Mar 18 2019

Bibliographical note

Funding Information:
This work was supported by the National Key Research and Development Program of China (MOST, Grant No. 2017YFA0206200) and the National Natural Science Foundation of China (NSFC, Grant Nos. 11434014, 51620105004, and 11674373) and partially supported by the Strategic Priority Research Program (B) (Grant No. XDB07030200), the International Partnership Program (Grant No. 112111KYSB20170090), and the Key Research Program of Frontier Sciences (Grant No. QYZDJ-SSWSLH016) of the Chinese Academy of Sciences (CAS). This work was also supported by the University of Minnesota Supercomputing Institute for computer time.

Publisher Copyright:
© 2019 Author(s).

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