Abstract
We have developed a simple, inexpensive, and easily incorporated technique for positioning point defects in free-standing smectic films, simplifying the study of defect structures in the moderate temperature window through probes such as depolarized reflected light microscopy. The technique exploits thermal flow in the smectic films to position and hold a point defect in place. We present details of the experimental design as well as measurements of the thermal flow induced by the device.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 1251-1257 |
| Number of pages | 7 |
| Journal | Liquid Crystals |
| Volume | 31 |
| Issue number | 9 |
| DOIs | |
| State | Published - Sep 2004 |
Bibliographical note
Funding Information:We are grateful to A. Cady, D. A. Olson, and X. F. Han for technical help and useful discussions. This research was supported in part by the National Science Foundation, Solid State Chemistry Program under Grant No. DMR-0106122.