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Thermal dependence of the refractive index of GaAs and AlAs measured using semiconductor multilayer optical cavities
J. Talghader
, J. S. Smith
Electrical and Computer Engineering
Research output
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Contribution to journal
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Article
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peer-review
91
Scopus citations
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Dive into the research topics of 'Thermal dependence of the refractive index of GaAs and AlAs measured using semiconductor multilayer optical cavities'. Together they form a unique fingerprint.
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Keyphrases
Gallium Arsenide
100%
Index of Refraction
33%
Laser Type
33%
Layered Structure
33%
Longitudinal Optical
33%
Mode Shift
33%
Optical Cavity
100%
Optical Modes
33%
Optical Resonators
33%
Refractive Index
100%
Semiconductor multilayer
100%
Thermal Dependence
100%
Vertical-cavity Surface-emitting Laser (VCSEL)
33%
Engineering
Cavity Surface
33%
Emitting Laser
33%
Gallium Arsenide
100%
Index of Refraction
33%
Layer Structure
33%
Optical Cavity
100%
Optical Mode
33%
Refractive Index
100%
Refractivity
100%
Resonator
33%
Physics
Optical Resonator
100%
Refractivity
100%
Surface Emitting Laser
100%