The synapse, Part IV: Recent observations: Preface

Research output: Contribution to journal › Editorial › peer-review

Original language	English (US)
Pages (from-to)	321
Number of pages	1
Journal	Journal of Electron Microscopy Technique
Volume	15
Issue number	4
DOIs	https://doi.org/10.1002/jemt.1060150402
State	Published - 1990

Publisher link

@article{08d2b93696864ac2bf7199100d850854,

title = "The synapse, Part IV: Recent observations: Preface",

author = "Hamos, \{J. E.\} and A. Beitz",

year = "1990",

doi = "10.1002/jemt.1060150402",

language = "English (US)",

volume = "15",

pages = "321",

journal = "Journal of Electron Microscopy Technique",

issn = "0741-0581",

publisher = "John Wiley \& Sons Inc.",

number = "4",

}

TY - JOUR

T1 - The synapse, Part IV

T2 - Recent observations: Preface

AU - Hamos, J. E.

AU - Beitz, A.

PY - 1990

Y1 - 1990

UR - https://www.scopus.com/pages/publications/0025335268

UR - https://www.scopus.com/pages/publications/0025335268#tab=citedBy

U2 - 10.1002/jemt.1060150402

DO - 10.1002/jemt.1060150402

M3 - Editorial

AN - SCOPUS:0025335268

SN - 0741-0581

VL - 15

SP - 321

JO - Journal of Electron Microscopy Technique

JF - Journal of Electron Microscopy Technique

IS - 4

ER -