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The role of back stress in sub-50 nm Si nanocubes
E. D. Hintsala
, A. J. Wagner
, W. W. Gerberich
,
K. A. Mkhoyan
Chemical Engineering and Materials Science
Materials Research Science & Engineering Center
Research output
:
Contribution to journal
›
Article
›
peer-review
16
Scopus citations
Overview
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(3)
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Dive into the research topics of 'The role of back stress in sub-50 nm Si nanocubes'. Together they form a unique fingerprint.
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Keyphrases
Nanocubes
100%
Back Stress
100%
Transmission Electron Microscope
25%
Dislocation-free
25%
Plastic Strain
25%
Effective Stress
25%
Low Stress
25%
Dislocation Motion
25%
Free Particle
25%
Multicrystalline Silicon
25%
In-situ Compression
25%
Constant Effective Stress
25%
Moving Dislocations
25%
Dislocation pile-up
25%
Engineering
Applied Stress
100%
Effective Stress
100%
Silicon Single Crystal
50%
Plastic Strain
50%
Dislocation Pile
50%
Dislocation Motion
50%
Material Science
Silicon
100%
Single Crystal
100%