The dependence of electron channeling line width degradation on deformation mode

M. Kaczorowski; W. W. Gerberich

doi:10.1016/0036-9748(86)90402-3

The dependence of electron channeling line width degradation on deformation mode

M. Kaczorowski, W. W. Gerberich

Chemical Engineering and Materials Science

Research output: Contribution to journal › Article › peer-review

8 Scopus citations

Abstract

The calibration curves for SACP line resolution versus deformation in simple tension and tension-tension fatigue cycling were evaluated. It follows from this study that SACP's degradation in the case of simple tension process distinctly faster than in fatigue. For this experiment those equations possess a from as follows: tension mm = 1.05 + 0.059 ε{lunate} fatigue m = 1.0 + 0.0836·ε{lunate}^0.7 The inference is that dislocation distributions have a strong effect on line broadening and hence on the correlation.

Original language	English (US)
Pages (from-to)	1597-1600
Number of pages	4
Journal	Scripta Metallurgica
Volume	20
Issue number	11
DOIs	https://doi.org/10.1016/0036-9748(86)90402-3
State	Published - Nov 1986

Bibliographical note

Funding Information:
The authors would llke to acknowledge support from the office of Basic Energy Sciences, Materials Science Division of the U.S. Department of Energy under Contract No. DE-FG02-84ER45141, and Ms. Lynn Selfried for technical assistance.

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title = "The dependence of electron channeling line width degradation on deformation mode",

abstract = "The calibration curves for SACP line resolution versus deformation in simple tension and tension-tension fatigue cycling were evaluated. It follows from this study that SACP's degradation in the case of simple tension process distinctly faster than in fatigue. For this experiment those equations possess a from as follows: tension mm = 1.05 + 0.059 ε{lunate} fatigue m = 1.0 + 0.0836·ε{lunate}0.7 The inference is that dislocation distributions have a strong effect on line broadening and hence on the correlation.",

author = "M. Kaczorowski and Gerberich, {W. W.}",

note = "Funding Information: The authors would llke to acknowledge support from the office of Basic Energy Sciences, Materials Science Division of the U.S. Department of Energy under Contract No. DE-FG02-84ER45141, and Ms. Lynn Selfried for technical assistance.",

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doi = "10.1016/0036-9748(86)90402-3",

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T1 - The dependence of electron channeling line width degradation on deformation mode

AU - Kaczorowski, M.

AU - Gerberich, W. W.

N1 - Funding Information: The authors would llke to acknowledge support from the office of Basic Energy Sciences, Materials Science Division of the U.S. Department of Energy under Contract No. DE-FG02-84ER45141, and Ms. Lynn Selfried for technical assistance.

PY - 1986/11

Y1 - 1986/11

N2 - The calibration curves for SACP line resolution versus deformation in simple tension and tension-tension fatigue cycling were evaluated. It follows from this study that SACP's degradation in the case of simple tension process distinctly faster than in fatigue. For this experiment those equations possess a from as follows: tension mm = 1.05 + 0.059 ε{lunate} fatigue m = 1.0 + 0.0836·ε{lunate}0.7 The inference is that dislocation distributions have a strong effect on line broadening and hence on the correlation.

AB - The calibration curves for SACP line resolution versus deformation in simple tension and tension-tension fatigue cycling were evaluated. It follows from this study that SACP's degradation in the case of simple tension process distinctly faster than in fatigue. For this experiment those equations possess a from as follows: tension mm = 1.05 + 0.059 ε{lunate} fatigue m = 1.0 + 0.0836·ε{lunate}0.7 The inference is that dislocation distributions have a strong effect on line broadening and hence on the correlation.

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ER -

The dependence of electron channeling line width degradation on deformation mode

Abstract

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