The dependence of electron channeling line width degradation on deformation mode

M. Kaczorowski, W. W. Gerberich

Research output: Contribution to journalArticlepeer-review

8 Scopus citations

Abstract

The calibration curves for SACP line resolution versus deformation in simple tension and tension-tension fatigue cycling were evaluated. It follows from this study that SACP's degradation in the case of simple tension process distinctly faster than in fatigue. For this experiment those equations possess a from as follows: tension mm = 1.05 + 0.059 ε{lunate} fatigue m = 1.0 + 0.0836·ε{lunate}0.7 The inference is that dislocation distributions have a strong effect on line broadening and hence on the correlation.

Original languageEnglish (US)
Pages (from-to)1597-1600
Number of pages4
JournalScripta Metallurgica
Volume20
Issue number11
DOIs
StatePublished - Nov 1986

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