TY - CHAP
T1 - The certainty of uncertainty
T2 - Randomness in nanometer design
AU - Chang, Hongliang
AU - Qian, Haifeng
AU - Sapatnekar, Sachin S.
PY - 2004/1/1
Y1 - 2004/1/1
N2 - Randomness and uncertainty are rearing their heads in surprising and contradictory ways in nanometer technologies. On the one hand, uncertainty and variability is becoming a dominant factor in the design of integrated circuits, and on the other hand, algorithms based on randomness are beginning to show great promise in solving large scale problems. This paper overviews both aspects of this issue.
AB - Randomness and uncertainty are rearing their heads in surprising and contradictory ways in nanometer technologies. On the one hand, uncertainty and variability is becoming a dominant factor in the design of integrated circuits, and on the other hand, algorithms based on randomness are beginning to show great promise in solving large scale problems. This paper overviews both aspects of this issue.
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U2 - 10.1007/978-3-540-30205-6_6
DO - 10.1007/978-3-540-30205-6_6
M3 - Chapter
AN - SCOPUS:35048884778
SN - 3540230955
T3 - Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
SP - 36
EP - 47
BT - Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
A2 - Macii, Enrico
A2 - Paliouras, Vassilis
A2 - Koufopavlou, Odysseas
PB - Springer Verlag
ER -