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Temperature-Dependent Absorption Measurements in High- and Low-Loss Regions of Silicon Nitride Membranes

  • Tanuj Kumar
  • , Demeng Feng
  • , Shenwei Yin
  • , Merlin Mah
  • , Phyo Lin
  • , Margaret Fortman
  • , Kevin Schnittker
  • , Chengyu Fang
  • , Joseph Andrews
  • , Ronald J. Warzoha
  • , Victor W. Brar
  • , Joseph J. Talghader
  • , Mikhail A. Kats

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present room- and high-temperature absorption measurements in stoichiometric silicon nitride (Si3N4) membranes using spectroscopic ellipsometry at high-loss wavelengths, and self-referencing photothermal common-path interferometry (PCI) at low-loss infrared wavelengths.

Original languageEnglish (US)
Title of host publicationCLEO
Subtitle of host publicationScience and Innovations - Proceedings CLEO 2025
PublisherOptical Society of America
ISBN (Electronic)9781957171500
DOIs
StatePublished - 2025
Event2025 CLEO: Science and Innovations, CLEO-SI 2025 - Long Beach, United States
Duration: May 4 2025May 9 2025

Publication series

NameCLEO: Science and Innovations - Proceedings CLEO 2025

Conference

Conference2025 CLEO: Science and Innovations, CLEO-SI 2025
Country/TerritoryUnited States
CityLong Beach
Period5/4/255/9/25

Bibliographical note

Publisher Copyright:
© Optica Publishing Group 2025.

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