TEM characterization of deformation and failure mechanisms in 40 nm and 5nm cu/nb nanolayed micro compression pillars

Nathan A. Mara, D. Bhattacharyya, P. Dickerson, R. G. Hoagland, A. Misra

Research output: Contribution to journalArticlepeer-review

3 Scopus citations
Original languageEnglish (US)
Pages (from-to)352-353
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberSUPPL. 2
StatePublished - Jul 2009

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