TECHNICAL PROGRAM OVERVIEW

Research output: Contribution to journal › Editorial › peer-review

Original language	English (US)
Article number	7962915
Journal	Proceedings of the American Control Conference
DOIs	https://doi.org/10.23919/ACC.2017.7962915
State	Published - Jun 29 2017
Event	2017 American Control Conference, ACC 2017 - Seattle, United States Duration: May 24 2017 → May 26 2017

Publisher link

@article{334c15a437a14b74a7151ab507db8346,

title = "TECHNICAL PROGRAM OVERVIEW",

author = "Rajesh Rajamani",

year = "2017",

month = jun,

day = "29",

doi = "10.23919/ACC.2017.7962915",

language = "English (US)",

journal = "Proceedings of the American Control Conference",

issn = "0743-1619",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

note = "2017 American Control Conference, ACC 2017 ; Conference date: 24-05-2017 Through 26-05-2017",

}

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T1 - TECHNICAL PROGRAM OVERVIEW

AU - Rajamani, Rajesh

PY - 2017/6/29

Y1 - 2017/6/29

UR - https://www.scopus.com/pages/publications/85027027825

UR - https://www.scopus.com/pages/publications/85027027825#tab=citedBy

U2 - 10.23919/ACC.2017.7962915

DO - 10.23919/ACC.2017.7962915

M3 - Editorial

AN - SCOPUS:85027027825

SN - 0743-1619

JO - Proceedings of the American Control Conference

JF - Proceedings of the American Control Conference

M1 - 7962915

T2 - 2017 American Control Conference, ACC 2017

Y2 - 24 May 2017 through 26 May 2017

ER -