TDDB in HfSiON/SiO2 dielectric stack: Büttiker probe based NEGF modeling, prediction and experiment

Ahmed Kamal Reza, Mohammad Khaled Hassan, Kaushik Roy, Devyani Patra, Ankita Bansal, Yu Cao

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

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Engineering

Material Science