System-level design for test of fully differential analog circuits

Bapiraju Vinnakota, Ramesh Harjani, Nicholas J. Stessman

Research output: Contribution to journalConference articlepeer-review

1 Scopus citations


Analog IC test occupies a significant fraction of the design cycle. Testing costs are increased by the twin requirements of high precision and accuracy in signal measurement. We discuss a system level ACOB technique for fully differential analog ICs. Our test techniques incorporate analog specific constraints such as device matching, and circuit and switching noise. They have a minimal impact on performance, area and power. The techniques can be used for both discrete and continuous time circuits, over a wide frequency range. The system level DFT scheme is also used to design a self-testing switched capacitor filter. Our checking scheme provides significant fault coverage and is demonstrably superior to other DFT techniques for differential circuits.

Original languageEnglish (US)
Pages (from-to)450-454
Number of pages5
JournalProceedings - Design Automation Conference
StatePublished - Jan 1 1995
EventProceedings of the 32nd Design Automation Conference - San Francisco, CA, USA
Duration: Jun 12 1995Jun 16 1995


Dive into the research topics of 'System-level design for test of fully differential analog circuits'. Together they form a unique fingerprint.

Cite this