SURFACES OF HIGH-Tc ″N63Ge″ FILMS AS STUDIED BY ELECTRON TUNNELING AND AUGER ELECTRON SPECTROSCOPY.

R. Buitrago, L. E. Toth, A. M. Goldman, M. Dayan

Research output: Contribution to journalArticlepeer-review

Abstract

Auger electron spectroscopy (AES) has been used to understand the nature of the surfaces of the top atomic layers of high-T//c sputter-deposited films of Nb//3Ge. Pb-Nb//3Ge tunneling junctions of high quality have been fabricated with oxidized thin aluminum barriers.

Original languageEnglish (US)
Pages (from-to)404-406
Number of pages3
JournalAIP Conf Proc
Volume44
Issue number1
StatePublished - Jan 1 1978

Fingerprint Dive into the research topics of 'SURFACES OF HIGH-T<sub>c</sub> ″N6<sub>3</sub>Ge″ FILMS AS STUDIED BY ELECTRON TUNNELING AND AUGER ELECTRON SPECTROSCOPY.'. Together they form a unique fingerprint.

Cite this