SURFACES OF HIGH-Tc ″N63Ge″ FILMS AS STUDIED BY ELECTRON TUNNELING AND AUGER ELECTRON SPECTROSCOPY.

R. Buitrago; L. E. Toth; A. M. Goldman; M. Dayan

SURFACES OF HIGH-T_c ″N6₃Ge″ FILMS AS STUDIED BY ELECTRON TUNNELING AND AUGER ELECTRON SPECTROSCOPY.

R. Buitrago, L. E. Toth, A. M. Goldman, M. Dayan

Physics and Astronomy (Twin Cities)

Research output: Contribution to journal › Article › peer-review

Abstract

Auger electron spectroscopy (AES) has been used to understand the nature of the surfaces of the top atomic layers of high-T//c sputter-deposited films of Nb//3Ge. Pb-Nb//3Ge tunneling junctions of high quality have been fabricated with oxidized thin aluminum barriers.

Original language	English (US)
Pages (from-to)	404-406
Number of pages	3
Journal	AIP Conf Proc
Volume	44
Issue number	1
State	Published - Jan 1 1978

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title = "SURFACES OF HIGH-Tc ″N63Ge″ FILMS AS STUDIED BY ELECTRON TUNNELING AND AUGER ELECTRON SPECTROSCOPY.",

abstract = "Auger electron spectroscopy (AES) has been used to understand the nature of the surfaces of the top atomic layers of high-T//c sputter-deposited films of Nb//3Ge. Pb-Nb//3Ge tunneling junctions of high quality have been fabricated with oxidized thin aluminum barriers.",

author = "R. Buitrago and Toth, {L. E.} and Goldman, {A. M.} and M. Dayan",

year = "1978",

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AU - Buitrago, R.

AU - Toth, L. E.

AU - Goldman, A. M.

AU - Dayan, M.

PY - 1978/1/1

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N2 - Auger electron spectroscopy (AES) has been used to understand the nature of the surfaces of the top atomic layers of high-T//c sputter-deposited films of Nb//3Ge. Pb-Nb//3Ge tunneling junctions of high quality have been fabricated with oxidized thin aluminum barriers.

AB - Auger electron spectroscopy (AES) has been used to understand the nature of the surfaces of the top atomic layers of high-T//c sputter-deposited films of Nb//3Ge. Pb-Nb//3Ge tunneling junctions of high quality have been fabricated with oxidized thin aluminum barriers.

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SURFACES OF HIGH-T_c ″N6₃Ge″ FILMS AS STUDIED BY ELECTRON TUNNELING AND AUGER ELECTRON SPECTROSCOPY.

Abstract

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