Keyphrases
A-Si
100%
Attenuated Total reflectance-Fourier Transform Infrared Spectroscopy (ATR-FTIR)
33%
Crystalline Silicon
33%
Decomposition Reaction
66%
H-surfaces
33%
Hydrides
66%
Hydrogen Coverage
33%
Hydrogenated
33%
Hydrogenated Amorphous Silicon
100%
In Situ Infrared
100%
Infrared Study
100%
Ion Flux
100%
Ion Temperature
100%
Silicon Hydride
33%
Silicon Surface
33%
Substrate Temperature
66%
Surface Dangling Bonds
33%
Surface Hydride
100%
Surface Sensitivity
33%
Temperature Effect
100%
Time Series Decomposition
33%
Engineering
Attenuated Total Reflection Infrared Spectroscopy
50%
Crystalline Silicon
50%
Dangling Bond
50%
Deposited Film
50%
Hydrogenated Amorphous Silicon
100%
Increasing Substrate Temperature
50%
Phase Composition
100%
Sensitive Surface
50%
Silicon Surface
100%
Substrate Temperature
50%
Temperature Dependence
100%
Physics
Amorphous Silicon
100%
Blood Plasma
100%
Infrared Spectroscopy
50%
Ion Current
100%
Ion Temperature
100%
Silane
50%
Temperature Dependence
100%
Material Science
Amorphous Silicon
100%
Chemical Decomposition
40%
Film
40%
Hydride
100%
Phase Composition
100%
Silicon
40%
Surface (Surface Science)
100%