Abstract
A null transmission ellipsometer was employed to study the uniaxial to biaxial smectic-A phase transition of a bent core liquid crystal material. Free-standing films of thicknesses ranging from 5 molecular layers to more than 300 were prepared and studied. Critical exponents for both the surface and interior biaxiality were obtained. The results were discussed in the general framework of phase transition in lower dimensions.
Original language | English (US) |
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Article number | 117802 |
Journal | Physical review letters |
Volume | 105 |
Issue number | 11 |
DOIs | |
State | Published - Sep 10 2010 |