Superconducting fluctuation rounding of the resistive transition of Nb.88Ti.12N films

A. M. Goldman, F. M. Schaer, L. E. Toth, J. Zbasnik

Research output: Contribution to journalArticle

3 Scopus citations

Abstract

A detailed study of the resistive transition of Nb.88Ti.12N films has been performed from 10 out to 50K to test the theory of superconducting fluctuations. A crucial prediction of this theory is a change in the temperature dependence of the resistance corresponding to a change in the ratio of the film thickness to the temperature-dependent coherence length from d/ξ(T) 3 to d/ξ(T) < 3. We believe that we have observed this transition. The value of Aslamazov-Larkin parameter obtained from the three-dimensional region (d/ξ 3) is about 1 3 the value computed from the normal sheet resistance of the film. A remarkable feature of the transition is that the superconducting fluctuations possibly affect the resistivity at temperatures as high as 33K.

Original languageEnglish (US)
Pages (from-to)234-242
Number of pages9
JournalPhysica
Volume55
Issue numberC
DOIs
StatePublished - Oct 1971

Fingerprint Dive into the research topics of 'Superconducting fluctuation rounding of the resistive transition of Nb<sub>.88</sub>Ti<sub>.12</sub>N films'. Together they form a unique fingerprint.

  • Cite this