Superconducting fluctuation rounding of the resistive transition of Nb.88Ti.12N films

A. M. Goldman; F. M. Schaer; L. E. Toth; J. Zbasnik

doi:10.1016/0031-8914(71)90256-4

Superconducting fluctuation rounding of the resistive transition of Nb_.88Ti_.12N films

A. M. Goldman, F. M. Schaer, L. E. Toth, J. Zbasnik

Physics and Astronomy (Twin Cities)

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

A detailed study of the resistive transition of Nb_.88Ti_.12N films has been performed from 10 out to 50K to test the theory of superconducting fluctuations. A crucial prediction of this theory is a change in the temperature dependence of the resistance corresponding to a change in the ratio of the film thickness to the temperature-dependent coherence length from d/ξ(T) 3 to d/ξ(T) < 3. We believe that we have observed this transition. The value of Aslamazov-Larkin parameter obtained from the three-dimensional region (d/ξ 3) is about 1 3 the value computed from the normal sheet resistance of the film. A remarkable feature of the transition is that the superconducting fluctuations possibly affect the resistivity at temperatures as high as 33K.

Original language	English (US)
Pages (from-to)	234-242
Number of pages	9
Journal	Physica
Volume	55
Issue number	C
DOIs	https://doi.org/10.1016/0031-8914(71)90256-4
State	Published - Oct 1971

Bibliographical note

Funding Information:
I Supported in part by the U.S. Atomic Energy Commission under and by U.S. Air Force Office of Scientific Research, Office of Aerospace $ Alfred P. Sloan Fellow

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10.1016/0031-8914(71)90256-4

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title = "Superconducting fluctuation rounding of the resistive transition of Nb.88Ti.12N films",

abstract = "A detailed study of the resistive transition of Nb.88Ti.12N films has been performed from 10 out to 50K to test the theory of superconducting fluctuations. A crucial prediction of this theory is a change in the temperature dependence of the resistance corresponding to a change in the ratio of the film thickness to the temperature-dependent coherence length from d/ξ(T) 3 to d/ξ(T) < 3. We believe that we have observed this transition. The value of Aslamazov-Larkin parameter obtained from the three-dimensional region (d/ξ 3) is about 1 3 the value computed from the normal sheet resistance of the film. A remarkable feature of the transition is that the superconducting fluctuations possibly affect the resistivity at temperatures as high as 33K.",

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T1 - Superconducting fluctuation rounding of the resistive transition of Nb.88Ti.12N films

AU - Goldman, A. M.

AU - Schaer, F. M.

AU - Toth, L. E.

AU - Zbasnik, J.

N1 - Funding Information: I Supported in part by the U.S. Atomic Energy Commission under and by U.S. Air Force Office of Scientific Research, Office of Aerospace $ Alfred P. Sloan Fellow

PY - 1971/10

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N2 - A detailed study of the resistive transition of Nb.88Ti.12N films has been performed from 10 out to 50K to test the theory of superconducting fluctuations. A crucial prediction of this theory is a change in the temperature dependence of the resistance corresponding to a change in the ratio of the film thickness to the temperature-dependent coherence length from d/ξ(T) 3 to d/ξ(T) < 3. We believe that we have observed this transition. The value of Aslamazov-Larkin parameter obtained from the three-dimensional region (d/ξ 3) is about 1 3 the value computed from the normal sheet resistance of the film. A remarkable feature of the transition is that the superconducting fluctuations possibly affect the resistivity at temperatures as high as 33K.

AB - A detailed study of the resistive transition of Nb.88Ti.12N films has been performed from 10 out to 50K to test the theory of superconducting fluctuations. A crucial prediction of this theory is a change in the temperature dependence of the resistance corresponding to a change in the ratio of the film thickness to the temperature-dependent coherence length from d/ξ(T) 3 to d/ξ(T) < 3. We believe that we have observed this transition. The value of Aslamazov-Larkin parameter obtained from the three-dimensional region (d/ξ 3) is about 1 3 the value computed from the normal sheet resistance of the film. A remarkable feature of the transition is that the superconducting fluctuations possibly affect the resistivity at temperatures as high as 33K.

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