The study of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin films using energy dispersive x-ray scattering and x-ray reflectivity was discussed. The average film composition was confirmed using energy dispersive x-ray spectroscopy of scanning electron microscopy. It was found that improved magnetic properties resulted from the combined effects of the higher crystallinity, better texture of CoCrPt (002) and higher interface roughness.
|Original language||English (US)|
|Journal||Digests of the Intermag Conference|
|State||Published - Dec 1 2002|
|Event||2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG - Amsterdam, Netherlands|
Duration: Apr 28 2002 → May 2 2002