Study of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin film using x-ray scattering and x-ray reflectivity

Chengjun J. Sun; Gan Moog Chow; J. P. Wang; Eng Wei Soo; J. H. Je

Study of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin film using x-ray scattering and x-ray reflectivity

Chengjun J. Sun, Gan Moog Chow, J. P. Wang, Eng Wei Soo, J. H. Je

Electrical and Computer Engineering

Research output: Contribution to journal › Conference article › peer-review

Abstract

The study of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin films using energy dispersive x-ray scattering and x-ray reflectivity was discussed. The average film composition was confirmed using energy dispersive x-ray spectroscopy of scanning electron microscopy. It was found that improved magnetic properties resulted from the combined effects of the higher crystallinity, better texture of CoCrPt (002) and higher interface roughness.

Original language	English (US)
Journal	Digests of the Intermag Conference
State	Published - Dec 1 2002
Event	2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG - Amsterdam, Netherlands Duration: Apr 28 2002 → May 2 2002

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title = "Study of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin film using x-ray scattering and x-ray reflectivity",

abstract = "The study of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin films using energy dispersive x-ray scattering and x-ray reflectivity was discussed. The average film composition was confirmed using energy dispersive x-ray spectroscopy of scanning electron microscopy. It was found that improved magnetic properties resulted from the combined effects of the higher crystallinity, better texture of CoCrPt (002) and higher interface roughness.",

author = "Sun, {Chengjun J.} and Chow, {Gan Moog} and Wang, {J. P.} and Soo, {Eng Wei} and Je, {J. H.}",

year = "2002",

month = dec,

day = "1",

language = "English (US)",

journal = "Digests of the Intermag Conference",

issn = "0074-6843",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

note = "2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG ; Conference date: 28-04-2002 Through 02-05-2002",

}

TY - JOUR

T1 - Study of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin film using x-ray scattering and x-ray reflectivity

AU - Sun, Chengjun J.

AU - Chow, Gan Moog

AU - Wang, J. P.

AU - Soo, Eng Wei

AU - Je, J. H.

PY - 2002/12/1

Y1 - 2002/12/1

N2 - The study of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin films using energy dispersive x-ray scattering and x-ray reflectivity was discussed. The average film composition was confirmed using energy dispersive x-ray spectroscopy of scanning electron microscopy. It was found that improved magnetic properties resulted from the combined effects of the higher crystallinity, better texture of CoCrPt (002) and higher interface roughness.

AB - The study of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin films using energy dispersive x-ray scattering and x-ray reflectivity was discussed. The average film composition was confirmed using energy dispersive x-ray spectroscopy of scanning electron microscopy. It was found that improved magnetic properties resulted from the combined effects of the higher crystallinity, better texture of CoCrPt (002) and higher interface roughness.

UR - http://www.scopus.com/inward/record.url?scp=17944392600&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=17944392600&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:17944392600

SN - 0074-6843

JO - Digests of the Intermag Conference

JF - Digests of the Intermag Conference

T2 - 2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG

Y2 - 28 April 2002 through 2 May 2002

ER -

Study of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin film using x-ray scattering and x-ray reflectivity

Abstract

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